k-Space is a leading supplier of metrology systems for thin-film and industrial metrology applications. For thin-film and semiconductor applications, we provide optical measurements for temperature, stress, curvature, bow, deposition rate, reflectivity, spectral reflectance and transmission, and reflection high-energy electron diffraction (RHEED). Our industrial metrology solutions cover many industries, including glass, solar, automotive, and building materials. The materials properties below are here to support you in use of our metrology or your other research applications. If you are interested in k-Space making an optical or materials properties measurement for you, please see our Characterization Services page.

MaterialChemical
Symbol
Bulk
Modulus
Young’s
Modulus
Poisson’s
Ratio
Biaxial
Modulus
950nm
Reflectance
950nm
Emissivity
470nm
Reflectance
470nm
Emissivity
n at
950nm
k at
950nm
n at
470nm
k at
470nm
Aluminum ArsenideAlAs2.97403.510
CopperCu140 GPa110 GPa0.34381.91 GPa
Float GlassSoda-lime Silica43 GPa72 GPa0.2393.51 GPa
Gallium AntimonideGaSb0.390.610.480.524.30.344.32.3
Gallium ArsenideGaAs75.5 GPa82.68 GPa0.31119.8 GPa0.3130.6870.4380.562
Gallium NitrideGaN204 GPa449.6 GPa2.3702.470
Gallium PhosphideGaP3.1703.60.01
Indium PhosphideInP71 GPa61 GPa0.3695.31 GPa0.3050.6950.3490.6513.370.23.8180.5
SapphireAl2O3240 GPa335 GPa0.25562 GPa (R-Plane)0.0750.9250.0780.922
SiliconSi101.97 GPa130.91 GPa0.28181.82 GPa0.3260.6740.4190.5813.630.014.550.02
Silicon Carbide4H-SiC220 GPa
Silicon Carbide6H-SiC97 GPa
Silicon Carbide3C-SiC441 GPa
Thin Film and Industrial Metrology Systems

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