k-Space Associates, Inc.

kSA 400 References

k-Space references are a compilation of published papers that either offer a review of the techniques used by the kSA 400, or specifically use the kSA 400 for work within the paper.

Review on RHEED – Introduction to RHEED
A.S. Arrot

Ultrathin Magnetic Structures I, Springer-Verlag, 1994, pp. 177-220

Review on RHEED – A Review of the Geometrical Fundamentals of RHEED with Application to Silicon Surfaces
John E. Mahan, Kent M. Geib, G.Y. Robinson, and Robert G. Long

J.V.S.T. A 8, 1990, pp. 3692-3700

Review on RHEED – Reflective High Energy Electron Diffraction (RHEED)- A Unique Tool For In-Situ Growth Monitoring
Oleg Maksimov, Material Research Institute, Pennsylvania State University

Vacuum Technology and Coating, August 2008

High mobility single-crystalline-like silicon thin films on inexpensive flexible metal foils by plasma enhanced chemical vapor deposition
P.Dutta, Y.Gao, M.Rathi, Y.Yao, Y.Li, M.Iliev, J.Martinez, V.Selvamanickama

Acta Materialia Volume 147, 1 April 2018, Pages 51-58

Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators
C.R.H. McRae, J.H. Béjanin, C.T. Earnest, T.G. McConkey, J.R. Rinehart, C. Deimert,
J.P. Thomas, Z.R. Wasilewski, and M. Mariantoni

Submitted for Publication 12-27-2017

Photo- and cathodoluminescence of Eu3+ or Tb3+ doped CaZrO3 films prepared by pulsed laser deposition

Kazushige Ueda, Yuhei Shimizu, Hiroshi Takashima, Florian Massuyeau, Stéphane Jobic

Optical Materials, Vol. 73, November 2017, Pages 504-508

Interfacial Misfit Array Technique for GaSb Growth on GaAs
(001) Substrate by Molecular Beam Epitaxy
D. Benyahia, Ł. Kubiszyn, K. Michalczewski, A. Keblowski,

P. Martyniuk, J. Piotrowski, and A. Rogalski

Journal of Electronic Materials, 07 September 2017

Two magnon scattering and anti-damping behavior in a two-dimensional epitaxial TiN/Py(tPy)/b-Ta(tTa) system
Nilamani Behera, Ankit Kumar, Sujeet Chaudhary and Dinesh K. Pandya

RSC Adv., 2017, 7, 8106

A prospective submonolayer template structure for integration of
functional oxides with silicon
Dmitry V. Averyanov, Christina G. Karateeva, Igor A. Karateev, Andrey M. Tokmachev, Mikhail V. Kuzmin, Pekka Laukkanen , Alexander L. Vasiliev, Vyacheslav G. Storchak

Materials and Design 116 (2017) 616–621

In situ stress observation in oxide films and how tensile stress influences oxygen ion conduction
Aline Fluri, Daniele Pergolesi, Vladimir Roddatis, Alexander Wokaun and Thomas Lippert

Nature Communications 10.1038/ncomms10692 (2016)

Topotactic Synthesis of the Overlooked Multilayer Silicene Intercalation Compound SrSi 2
Andrey Tokmachev, Dmitry Averyanov, Igor Karateev, Oleg Parfenov, Alexander L. Vasiliev, Sergey Yakunin and Vyacheslav Storchak

Nanoscale, 20 Jul 2016

Atomic-Scale Engineering of Abrupt Interface for Direct Spin Contact of Ferromagnetic Semiconductor with Silicon
Dmitry V. Averyanov, Christina G. Karateeva, Igor A. Karateev, Andrey M. Tokmachev, Alexander L. Vasiliev, Sergey I. Zolotarev, Igor A. Likhachev & Vyacheslav G. Storchak

Scientific Reports | 6:22841 | DOI: 10.1038/srep22841

Disentanglement of Growth Dynamic and Thermodynamic Effects in LaAlO3/SrTiO3 Heterostructures
Chencheng Xu, Christoph Bäumer, Ronja Anika Heinen, Susanne Hoffmann-Eifert, Felix Gunkel & Regina Dittmann

Nature, Scientific Reports 6, Article Number:22410 (2016)

Nanocrystalline Ferroelectric BiFeO3 Thin Films by Low Temperature Atomic Layer Deposition
Mariona Coll, Jaume Gazquez, Ignasi Fina, Zakariaya Khayat, Andy Quindeau, Marin Alexe, Maria Varela, Susan Trolier-McKinstry , Xavier Obradors, and Teresa Puig

Chem. Mater. To be published 20 Aug 2015

In Situ Composition Monitoring Using RHEED for SrTiO3 Thin Films Grown by Reactive Coevaporation
Luke S.-J Peng and Brian H. Moeckly

J.V.S.T. A 22, 2004, pp. 2437-2439

RHEED Monitoring of Rotating Samples During Large-Area Homogeneous Deposition of Oxides
V. C. Matijasevic, Z. Lu, K. Von Dessonneck, C. Taylor, D. Barlett

MRS Fall Meeting, 1997

Growth and magnetic properties of Co x Ni 1-x ultrathin films on Cu(100)
F. O. Schumann, S. Z. Wu, G. J. Mankey, and R. F. Willis

Physical Review B, Vol. 56, no.5, 1997

Smoothening of Cu films grown on Si(001)
R. A. Lukaszew, Y. Sheng, C. Uher, and R. Clarke

Appl. Phys. Lett., Vol. 76, no.6, 2000

Temperature-Dependent Strain Relaxation and Islanding of Ge/Si(111)
P. W. Deelman, L. J. Schowalter, and T. Thundat

Proc. Materials Research Society Vol. 399 (1996)

Structural transition in epitaxial Co-Cr superlattices
W. Vavra, D. Barlett, S. Elagoz, C. Uher, and R. Clarke

Physical Review B Vol. 47, no.9, 1993

Resonant RHEED Study of Cu 3Au(111) Surface Order
S. W. Bonham and C. P. Flynn

University of Illinois at Urbana-Champaign

Molecular Beam Epitaxial Growth of InAs/AlGaAsSb Deep Quantum Wells on GaAs Substrates
N. Kuze, H. Goto, S. Miya, S. Muramatsu, M. Matsui, I. Shibasaki

Proc. Materials Reearch Society Vol. 3999 (1996)

Studies of Exchange Coupling in Fe(001) Whisker/Cr/Fe Structures using BLS and RHEED Techniques
B. Heinrich, M. From, J. F. Cochran, L. X. Liao, Z. Celinski, C. M. Schneider and K. Myrtle

Mat. Res. Soc. Symp. Proc. Vol. 313

The Use of RHEED Intensities for the Quantitative Characterization of Surfaces
Y. Ma, S. Lordi and J. A. Eades

Proc. Materials Research Society Vol. 399 (1996)

The molecular beam epitaxy growth of InGaAs on GaAs(100) studied by in situ scanning tunneling microscopy and reflection high-energy electron diffraction
C. W. Snyder, D. Barlett, B. G. Orr, P. K. Bhattacharya and J. Singh

J. Vac. Sci. Technol. B 9 (4), Jul/Aug 1991

Morphology Transition and Layer-by-Layer Growth of Rh(111)
F. Tsui, J. Wellman, C. Uher, and Roy Clarke

Physical Review Letters, Vol. 76, no. 17, 1996

CCD-Based RHEED Detection and Analysis System
D. Barlett, C.W. Snyder, B.G. Orr, and Roy Clarke

Rev. Sci. Instrum. 62, 1991, pp. 1263-1269