k-Space Associates, Inc. is excited to announce the release of kSA RCM (reflectance and color monitoring) to its industrial metrology product line. k-Space engineered the kSA RCM tool to measure absolute, real-time spectral reflectance and color to ensure consistency across reflective surfaces such as glass lites and solar panels.

The tool measures and provides real-time feedback for process control of color and reflectance, which is essential to yield and quality. The kSA RCM consists of an optics head attached to a dual linear-stage system to scan the panel or lite. It sends a beam of light incident to the panel, and the spectrometer collects the reflected light. The k-Space software analyzes and stores the acquired data, measuring absolute spectral reflectance and Lab* color parameters. k-Space can integrate this technology into an existing QC system, PLCs, or factory database.

“What makes our industrial metrology product line unique is our ability to customize the technology and integrate it into our customers’ existing systems. k-Space is known for working closely with our customers to learn their needs and then designing systems that fulfill their specific requirements. Each piece of equipment that we install at an industrial customer site is unique to their facility and their specific applications. We have received a lot of positive feedback from our customers, and they have told us they value our ability to incorporate our tools into their existing equipment and QC systems, PLCs, etc.,” stated Darryl Barlett, CEO of k-Space.

For more information about the kSA RCM, visit our website at https://www.k-space.com/industrial-metrology/.

Thin Film and Industrial Metrology Systems

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