To offer customers and potential customers insight into how k-Space tools are used in cutting edge research, k-Space maintains a list of applicable publications under each k-Space product. While these are by no means complete lists, they are an excellent resource for customers.
We have recently added 9 new references to our website pertaining to kSA BandiT, kSA MOS, and kSA UltraScan. We have also added a new application note which is based on a poster presented by First Solar, Keyence, and k-Space at the 2018 NREL PV Reliability Workshop and highlights in-line process control tools offered by k-Space.
The newly referenced publications cover the application areas of electro-thermal aging, lithiation of Sn electrodes, optical coatings, thermocompression bonding, properties of niobium films, and more. Specifically, the “Mechanisms of power module source metal degradation during electro-thermal aging” paper by Roberta Ruffilli, Mounira Berkani, Philippe Dupuy, Stephane Lefebvre, Yann Weber, and Marc Legros, examines aluminum metallization reliability in power MOSFETs [1]. They used the kSA MOS to measure stress variation as a function of temperature from -90 °C to 350 °C. The figure to the right shows the measurement set up and a schematic of the kSA MOS laser array. The schematic shows convex curvature with increasing temperature and thus a tensile film, and a reduction in spot spacing with decreasing temperature indicating a compressive film.
Check out the references under each product’s page or under the references menu. If you would like your paper added to our reference list, please email us at requestinfo@k-space.com with your publication details and we will be happy to add it to our site.
[1] Ruffilli R., et. al., Microelectronics Reliability (2017)
