The solar industry is quite competitive and with that comes the need for thin film solar companies to continuously improve their processes and products.
k-Space is constantly developing new photovoltaic (pv) metrology for thin film solar cell manufacturing. Currently, we have the proven capability to measure various parameters on frame components, bare glass, coated glass, and fully assembled panels, as well as edge profile inspection. We can customize our metrology to tackle your specific needs in any of these areas.
Here is a look at some of the custom capabilities we offer with our tools:
- Detect oil contamination and other cosmetic defects through the use of line scan cameras with UV and white light sources.
- Detect chips, cracks, contaminants, and panel dimensions through the use of line scan cameras with white light illumination.
- Examine edge contour, defects, and dimensions through edge profile inspection through the use of laser-based metrology.
- Measure and control uniformity, thickness, band gap, temperature, surface roughness, and more through the use of patented kSA BandiT technology.
Our pv metrology solutions for measuring edge sealant, edge profiler, and edge pinch were featured in a laser-based metrology poster presented at the 2018 NREL PV Reliability Workshop.
What are your measurement challenges? K-Space loves designing custom metrology to help you gain insight into your process and achieve your goals.