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09/30/2020

k-Space Newsletter No. 43

New Website Look We have given the k-Space website a facelift to make it easier for both our thin film metrology and industrial metrology customers to find the information that they […]

06/29/2020

Quantum Computing: k-Space Is Part of the Future with Low Temperature Qubit Fabrication k-Space recently installed a kSA BandiT non-contact optical temperature monitoring system on an Angstrom Engineering (www.angstromengineering.com) Quantum […]

03/25/2020

k-Space Newsletter No. 41

Continuous Reflectivity Measurements for Growth Rate and Emissivity-Corrected Pyrometry in MBE Systems Obtaining continuous reflectivity measurements in MBE systems is challenging due to the variation in the reflectivity signals caused […]

12/11/2019

k-Space Newsletter No.40

k-Space Starts Construction of Second Manufacturing Facility k-Space Associates, Inc. broke ground for the construction of its second building, which will be located next to k-Space’s current headquarters in the […]

09/18/2019

k-Space Newsletter No.39

Beam Alignment Substrate for Easier RHEED Beam Adjustment Have you ever heard of a “beam alignment substrate”? These substrates are an efficient and easy way to both properly align and […]

06/19/2019

k-Space Newsletter No. 38

k-Space Ships Custom In-Line Metrology to Dynamic Glass Manufacturer k-Space Associates, Inc. is proud to announce the shipment of multiple process control systems that measure color consistency during the production […]

03/19/2019

k-Space Newsletter No. 37

Silicon Band Edge Measurements Under Water Interface It is possible to measure the band edge temperature (BET) of a semiconductor wafer under a transparent liquid surface. The key is in […]

12/11/2018

k-Space Newsletter No. 36

Template Analysis Now Available for Scanning BandiT Tools kSA BandiT’s Scanning Detector Option provides an automated, motor-controlled detector for scanning the radius of a platen during rotation, which yields full […]

09/27/2018

k-Space Newsletter No. 35

What Do You Want to Measure? Custom Metrology Solutions k-Space has provided custom metrology solutions for over 15 years, developing both multi-point in-line measurements and large-scale off-line mapping measurements for […]

07/03/2018

k-Space Newsletter No. 34

More Robust Growth Rate Fitting Results With Damped Sine Fit The kSA 400 RHEED analysis tool has a new damped sine fit analysis feature to measure growth rate from RHEED […]

10/05/2017

k-Space Newsletter No. 33

k-Space Wins ETF Award for Atomic Absorption Spectroscopy Tool Commercialization k-Space is pleased to announce that we have received an Emerging Technologies Fund (ETF) award from the Michigan Economic Development […]

06/14/2016

k-Space Newsletter No. 32

Atomic Absorption Spectroscopy – k-Space Awarded $1.2M SBIR Phase II from the U.S. DOE We are pleased to announce that we received a $1.2M Phase II Small Business Innovation Research […]

03/16/2016

k-Space Newsletter No. 31

Do you need an automated, quantitative method for evaluating wafer carriers? The kSA Emissometer measures a wafer carrier’s diffuse reflectance, specular reflectance and emissivity as a function of position and provides complete wafer carrier maps and analysis. This data can help reduce costs and […]