k-Space Associates, Inc.

News

  • 06/28/2019
    Settings Tips for your kSA BandiT System

    k-Space wants to make your thin-film metrology tools as easy to use as possible. With this in mind, we have a new “BandiT User Settings” document that describes personalizing your kSA BandiT settings for easier thin-film temperature monitoring. The first tip explains how to save your kSA BandiT Settings, which allows you to create a […]

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  • 06/19/2019
    k-Space Newsletter No. 38

    k-Space Ships Custom In-Line Metrology to Dynamic Glass Manufacturer k-Space Associates, Inc. is proud to announce the shipment of multiple process control systems that measure color consistency during the production of dynamic glass. This installation is the first of many to a North American manufacturer. The customized in-line metrology uses optical, non-contact measurement to obtain […]

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  • 06/04/2019
    k-Space Ships Custom In-Line Metrology to Dynamic Glass Manufacturer

    FOR IMMEDIATE RELEASE Contact: Kathy Wheeler, k-Space Associates, Inc., [email protected] (Dexter, MI, June 4, 2019) – k-Space Associates, Inc. is proud to announce the shipment of multiple process control systems that measure color consistency during the production of dynamic glass. This installation is the first of many to a North American manufacturer. The customized in-line […]

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  • 06/03/2019
    New Batch Export Feature Makes kSA Software Even Easier

    Many scientists and engineers like to export the data they collect in their k-Space in-situ metrology software. When several data files are captured, it can be tedious to export multiple files to excel or the desired file type. To this end, we have added a batch export capability to the k-Space software suite. With the […]

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  • 05/28/2019
    New Research Uses k-Space Metrology

    k-Space metrology tools are routinely used in studies around the world. References are available so that others can gain insight into how k-Space metrology tools are used for research in thin-films and other areas, and how they can be utilized in production environments. The following references for the kSA MOS, kSA MOS UltraScan/ThermalScan, kSA BandiT, […]

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  • 04/26/2019
    Integrated Control for Epitaxy (ICE) for MBE Literature Now Available

    The k-Space Integrated Control for Epitaxy (kSA ICE) metrology tool has traditionally been used for growth monitoring and control on MOCVD reactors. MBE systems can also benefit from this technology through process control to improve efficiency and product quality. With optics customized to accommodate the longer optical path lengths and large substrate wobble often found […]

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