k-Space Associates, Inc.

News

  • 04/26/2019
    Integrated Control for Epitaxy (ICE) for MBE Literature Now Available

    The k-Space Integrated Control for Epitaxy (kSA ICE) metrology tool has traditionally been used for growth monitoring and control on MOCVD reactors. MBE systems can also benefit from this technology through process control to improve efficiency and product quality. With optics customized to accommodate the longer optical path lengths and large substrate wobble often found […]

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  • 04/23/2019
    IDL Programming to Customize kSA 400 – New Application Note Available

    IDL, short for Interactive Data Language, is a powerful programming language used to process large amounts of data and/or digital images. First developed in the 1970s at the Laboratory for Atmospheric and Space Physics (LASP) at the University of Colorado at Boulder, IDL has been widely applied in industries that require high-speed digital image processing […]

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  • 03/19/2019
    k-Space Newsletter No. 37

    Silicon Band Edge Measurements Under Water Interface It is possible to measure the band edge temperature (BET) of a semiconductor wafer under a transparent liquid surface. The key is in collecting a proper reference, whether through reflection or transmission. In our new application note, we use a kSA BandiT temperature measurement system to show proper […]

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  • 03/18/2019
    New Research References Using kSA Metrology Tools

    Do you want to know how k-Space metrology tools are used by researchers? Learning how others incorporate these tools into their own research can spark new ideas and provide valuable insight. Recently, we have added the following three new references to the website: kSA 400 (analytical RHEED system) – Konfederatova, K.A., Mansurov, V.G., Malin, T.V. […]

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  • 02/27/2019
    kSA BandiT Now Available in a UV/VIS Model

    The kSA BandiT is now available in a UV/VIS model! This allows reproducible substrate temperature determination for IR-transparent, wide band-gap materials including GaN, GaN on sapphire, SiC, Ga2O3, AlN, and AlN on sapphire. The kSA UV BandiT makes a direct measurement of the wafer or film temperature, not the temperature of a backside metal coating […]

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  • 02/07/2019
    k-Space Associates, Inc. Announces Increased Sales of kSA 400 Analytical RHEED Systems

    k-Space Associates, Inc., a leader in in situ, ex situ and in-line metrology tools for the thin-film, semiconductor, photovoltaic (PV), solar, automotive, glass, and building materials industries, has announced increased annual sales for the kSA 400 product line. They reported an increase of 27% in kSA 400 installations in 2018 for their kSA 400 analytical […]

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