k-Space Associates, Inc.


  • 06/04/2019
    k-Space Ships Custom In-Line Metrology to Dynamic Glass Manufacturer

    FOR IMMEDIATE RELEASE Contact: Kathy Wheeler, k-Space Associates, Inc., [email protected] (Dexter, MI, June 4, 2019) – k-Space Associates, Inc. is proud to announce the shipment of multiple process control systems that measure color consistency during the production of dynamic glass. This installation is the first of many to a North American manufacturer. The customized in-line […]

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  • 06/03/2019
    New Batch Export Feature Makes kSA Software Even Easier

    Many scientists and engineers like to export the data they collect in their k-Space in-situ metrology software. When several data files are captured, it can be tedious to export multiple files to excel or the desired file type. To this end, we have added a batch export capability to the k-Space software suite. With the […]

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  • 05/28/2019
    New Research Uses k-Space Metrology

    k-Space metrology tools are routinely used in studies around the world. References are available so that others can gain insight into how k-Space metrology tools are used for research in thin-films and other areas, and how they can be utilized in production environments. The following references for the kSA MOS, kSA MOS UltraScan/ThermalScan, kSA BandiT, […]

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  • 04/26/2019
    Integrated Control for Epitaxy (ICE) for MBE Literature Now Available

    The k-Space Integrated Control for Epitaxy (kSA ICE) metrology tool has traditionally been used for growth monitoring and control on MOCVD reactors. MBE systems can also benefit from this technology through process control to improve efficiency and product quality. With optics customized to accommodate the longer optical path lengths and large substrate wobble often found […]

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  • 04/23/2019
    IDL Programming to Customize kSA 400 – New Application Note Available

    IDL, short for Interactive Data Language, is a powerful programming language used to process large amounts of data and/or digital images. First developed in the 1970s at the Laboratory for Atmospheric and Space Physics (LASP) at the University of Colorado at Boulder, IDL has been widely applied in industries that require high-speed digital image processing […]

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  • 03/19/2019
    k-Space Newsletter No. 37

    Silicon Band Edge Measurements Under Water Interface It is possible to measure the band edge temperature (BET) of a semiconductor wafer under a transparent liquid surface. The key is in collecting a proper reference, whether through reflection or transmission. In our new application note, we use a kSA BandiT temperature measurement system to show proper […]

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