k-Space Closed For Memorial Day

k-Space will be closed Monday, May 31st, in observance of Memorial Day. We will resume regular business hours on Tuesday, June 1st.

Read more »


New Reflectance and Color Metrology System Introduced by k-Space Associates, Inc.

k-Space Associates, Inc. is excited to announce the release of kSA RCM (reflectance and color monitoring) to its industrial metrology product line. k-Space engineered the kSA RCM tool to measure […]

Read more »


X-Ray Fluorescence Layer Thickness Product Released by k-Space Associates, Inc.

As k-Space Associates, Inc. continues to expand their industrial metrology product line, they are excited to introduce the newest addition, the kSA XRF (X-ray fluorescence). This metrology system measures the […]

Read more »


New Spectral Reflectance Product Released by k-Space Associates, Inc.

k-Space Associates, Inc. is excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, and growth rate. This tool […]

Read more »


Additional Information on Several Glass and Solar Metrology Tools Now Available

k-Space is excited to announce that additional information is now available on its website for four of our non-contact solar and glass inspection metrology tools. The glass and solar industries […]

Read more »


k-Space Newsletter No. 45

Gain More Insight Into Your Growth with New kSA Accessory We are excited to announce the addition of a new accessory, kSA Insight Plus, for our metrology equipment. This tool […]

Read more »


New Software Feature Now Available for Copying and Pasting Data that Corresponds to a Chart

We at k-Space are well known for our powerful analysis software and our commitment to continuously improving the features in our software products. In the newest versions of our software, […]

Read more »


k-Space Ships 5 Glass Breakage Metrology Systems

k-Space Associates, Inc. is proud to announce that they shipped five glass breakage and defect detection metrology systems to the U.S. and Asia for a large international manufacturing customer. The […]

Read more »
Thin Film and Industrial Metrology Systems

Have a measurement challenge in mind?

One of the pillars of our success is standing by as consultants. We’re always here to talk about your project needs.

Contact Us