k-Space Associates, Inc.

News

  • 03/19/2019
    k-Space Newsletter No. 37

    Silicon Band Edge Measurements Under Water Interface It is possible to measure the band edge temperature (BET) of a semiconductor wafer under a transparent liquid surface. The key is in collecting a proper reference, whether through reflection or transmission. In our new application note, we use a kSA BandiT temperature measurement system to show proper […]

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  • 03/18/2019
    New Research References Using kSA Metrology Tools

    Do you want to know how k-Space metrology tools are used by researchers? Learning how others incorporate these tools into their own research can spark new ideas and provide valuable insight. Recently, we have added the following three new references to the website: kSA 400 (analytical RHEED system) – Konfederatova, K.A., Mansurov, V.G., Malin, T.V. […]

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  • 02/27/2019
    kSA BandiT Now Available in a UV/VIS Model

    The kSA BandiT is now available in a UV/VIS model! This allows reproducible substrate temperature determination for IR-transparent, wide band-gap materials including GaN, GaN on sapphire, SiC, Ga2O3, AlN, and AlN on sapphire. The kSA UV BandiT makes a direct measurement of the wafer or film temperature, not the temperature of a backside metal coating […]

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  • 02/07/2019
    k-Space Associates, Inc. Announces Increased Sales of kSA 400 Analytical RHEED Systems

    k-Space Associates, Inc., a leader in in situ, ex situ and in-line metrology tools for the thin-film, semiconductor, photovoltaic (PV), solar, automotive, glass, and building materials industries, has announced increased annual sales for the kSA 400 product line. They reported an increase of 27% in kSA 400 installations in 2018 for their kSA 400 analytical […]

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  • 01/28/2019
    k-Space Welcomes Chipo Mulaisho

    k-Space is proud to announce the addition of Chipo Mulaisho as Technical Sales Engineer. Chipo is a graduate of the University of Michigan, where he obtained a Masters in Materials Science and Engineering. While at U of M Chipo worked under both the Boukai and Millunchick research groups. “I am excited to help provide customers […]

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  • 12/11/2018
    k-Space Newsletter No. 36

    Template Analysis Now Available for Scanning BandiT Tools kSA BandiT’s Scanning Detector Option provides an automated, motor-controlled detector for scanning the radius of a platen during rotation, which yields full wafer and platen temperature mapping in situ. Thermal uniformity profiles can be monitored at various thermocouple temperature setpoints and at various points in the grower’s device […]

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