k-Space Associates, Inc.

  • Product kSA BandiT

    Repeatable and Accurate Temperature Measurement

  • Product kSA MOS

    2D Real-Time, In Situ Film and Thermal Stress Monitoring

  • Product kSA MOS Ultra/Thermal-Scan

    2D Film Stress and Absolute Curvature Mapping

  • Product kSA ICE

    Real-Time, In Situ Process Monitoring and Control for MOCVD

  • Product kSA BandiT PV

    In-line PV Process Monitoring to Increase Performance and Yield

  • Product kSA RateRat

    Real-time Thickness Monitoring of Multilayer Thin Films

  • Product kSA 400

    The World's Leading Analytical RHEED System

  • Product kSA SpectraTemp

    Absolute Temperature Made Absolutely Easy!

  • Product kSA Scanning Pyro

    Full Carrier Temperature Maps at the Click of a Button!

  • Product kSA Emissometer

    Ex Situ MOCVD Carrier Characterization

  • Product In-Line Metrology

    Custom In-Line Monitoring and Process Control

Leaders in Custom and Thin-Film Metrology Solutions for Research, Development, and Production

k-Space Associates, Inc. is a leading manufacturer of in-line, in situ, and ex situ metrology tools for the semiconductor, thin-film, photovoltaic (PV), solar, automotive, glass, and building materials industries. Our tools and custom metrology solutions are in research and production facilities around the world.

What's New at k-Space

World Class Technical Support

We take pride in providing the best technical support in the industry. No automated queues, no slow response times. When you call, you’ll always get a friendly k-Space person to direct your call to the appropriate engineer. Or, contact us via email – we guarantee we’ll respond within 1 business day. Contact us today so we can discuss your thin-film metrology needs.

We look forward to hearing from you!

Curious about our company? Check out our video featuring our facility, our people and where we turn ideas into reality!

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What We Do

For the thin-film, semiconductor and photovoltaic (PV) industries, k-Space thin film metrology tools focus on real-time data acquisition, processing, and analysis of nearly all deposition parameters of importance. These parameters include wafer and film temperature, thin-film stress and strain, wafer curvature, bow and tilt, surface roughness and quality, film thickness and deposition rate, optical band gap and atomic spacing. We also supply ex situ wafer and surface analysis tools that perform full curvature, stress, and wafer bow mapping on up to 300mm wafers.

For industrial applications, k-Space is known for its ability to provide robust data and analysis for in-line metrology solutions in production environments. k-Space works side by side with the customer to understand their specific needs, and then develops a custom solution to meet measurement requirements. This includes technology, software, data analysis, customization, automation of measurements, and integration with existing systems.

Our tools are used in today’s most advanced thin-film deposition and processing applications within compound semiconductor, silicon semiconductor and photovoltaic advanced thin film production and R&D.  Sophisticated software analysis and reporting capabilities provide information to better understand tomorrow’s electronic and optoelectronic devices, or to provide online control during mass production to enhance yield. Tailored optics and fully integrated solutions have been designed for simple mounting and non-invasive monitoring of advanced deposition processes such as: MOCVD, MBE, sputtering, thermal and e-beam evaporation, and PLD.