Leaders in thin film and industrial metrology
Putting Light to WorkSince 1992
Thin Film Metrology
Leading manufacturer of in-line, in situ, and ex situ metrology tools for the semiconductor and thin-film industries.
Industrial Metrology
Custom non-contact measurements and software integration for production environments. Measure and control uniformity, dimensions, surface characteristics, and more.
World Class Technical Support
We take pride in providing the best technical support in the industry. No automated queues, no slow response times. When you call, you’ll always get a friendly k-Space person to direct your call to the appropriate engineer. Or, contact us via email – we guarantee we’ll respond within 1 business day. Contact us today so we can discuss your thin-film metrology needs.
We look forward to hearing from you!
About k-Space
Incorporated in 1992 and driven to supply the best technical support in the industry, our tools are used worldwide in both research and full production monitoring of semiconductor, PV, thin-film deposition, annealing, and processing applications.
