Inline Glass Breakage Detection System for Glass and Solar Panel Inspection

Inline Glass Breakage Detection System for Glass and Solar Panel Inspection

The kSA Glass Breakage & Defect Detection tool is a vision-based metrology system that determines Go/No-Go (Pass/Fail) conditions for every glass lite and panel it inspects inline during processing. The tool accomplishes this by comparing coated or uncoa

kSA 400 RHEED Analysis Software Feature – Damped Sine Fit

kSA 400 RHEED Analysis Software Feature – Damped Sine Fit

The kSA 400 combines a high-resolution, high-speed, and high-sensitivity camera with sophisticated RHEED-specific acquisition and analysis software. This flexible system enables the analysis of virtually any image feature and, with one of many additional

How to Batch Export kSA 400 RHEED Images

How to Batch Export kSA 400 RHEED Images

Watch this video to see how to batch export images with the kSA 400 RHEED analysis system. This software feature makes exporting multiple images at once happen with just a few clicks of the mouse.

kSA MOS UltraScan – New Mapping Capabilities

kSA MOS UltraScan – New Mapping Capabilities

Introducing absolute reflectivity mapping and thickness mapping, now available with the kSA MOS UltraScan.

kSA 400 Analytical RHEED System Auto Exposure Control

kSA 400 Analytical RHEED System Auto Exposure Control

Watch the auto exposure control demonstration on the kSA 400 Analytical RHEED system. The intensity is never lost as it increases or decreases because the exposure time automatically adjusts. The intensity is also scaled with the exposure time so the abs

GaN-LED Still in Wafer Form

GaN-LED Still in Wafer Form

Check out how much light comes from a GaN-LED that is still in wafer form (no circuitry yet).  Only ~ 3.5V and very little current was applied – that’s some serious blue light!  Lots of light and very little power required – that’s the real pow

Control Your Stress with kSA MOS Technology

Control Your Stress with kSA MOS Technology

kSA MOS technology measures the stress, strain and curvature of thin films in situ, during the thin-film deposition or thermal annealing process.

Molecular-beam epitaxy (MBE) at work with kSA products

Molecular-beam epitaxy (MBE) at work with kSA products

Bob Sacks, Director of MBE at Picometrix, explains MBE and using the kSA 400 as a way to "spray paint with atoms."

Making kSA BandiT

Making kSA BandiT

Inside the development of the industry-leading wafer temperature measurement system.

Unleash the Power of RHEED with the kSA 400

Unleash the Power of RHEED with the kSA 400

See the kSA 400 in action as Bob Sacks, Director of MBE at Picometrix, describes how he uses the kSA 400 for growth rate monitoring on a daily basis.

kSA 400 and kSA BandiT in Action at Customer Site

kSA 400 and kSA BandiT in Action at Customer Site

See both the kSA 400 and kSA BandiT in action on a Veeco GEN III MBE reactor.

GaAs Real Time Thickness Measurement with kSA BandiT

GaAs Real Time Thickness Measurement with kSA BandiT

Real-time thickness measurement of GaAs from below-gap interference fringes.

GaAs – Temperature Ramp with kSA BandiT

GaAs – Temperature Ramp with kSA BandiT

Watch the kSA BandiT measure the temperature ramp of GaAs from room temperature to 340ºC.

Panel Edge Profiler Metrology System (“Edge Grind”)

Panel Edge Profiler Metrology System (“Edge Grind”)

The kSA Panel Edge Profiler Metrology System is a non-contact, inline glass metrology tool that measures the edge profile of a glass lite or panel.

kSA RateRat – Growth of a Single Transparent Film

kSA RateRat – Growth of a Single Transparent Film

Watch the kSA RateRat monitor the growth of a single transparent film on a transparent substrate, viewed at normal incidence.

Thin Film and Industrial Metrology Systems

Have a measurement challenge in mind?

One of the pillars of our success is standing by as consultants. We’re always here to talk about your project needs.

Contact Us