k-Space Associates, Inc., leaders in thin film characterization products, announced today the worldwide release of its newest product, kSA SpectraTemp, a unique, self-calibrating absolute source temperature measurement tool.
k-Space CEO, Darryl Barlett, commented, “Absolute temperature is a very difficult parameter to measure. With kSA SpectraTemp, if the source radiation is blackbody-like, an absolute temperature is instantly determined.”
kSA SpectraTemp is a non-contact, optically-based technique for measuring the temperature of semiconductor wafers, metals, ceramics, and much more. It is based on patented technology that analyzes the spectral radiation profile utilizing a solid-state spectrometer, resulting in fast data acquisition and real-time temperature measurement. The user simply reads the temperature from the screen.
MOCVD and other thin-film deposition facilities can use it to measure absolute temperature on wafer carriers, providing more accurate and reliable temperatures and tool-to-tool matching. As production facilities adopt this technology and gain better temperature control, device yield and quality will improve.
About k-Space Associates, Inc.
k-Space Associates, Inc. (www.k-space.com/) is a leading supplier of advanced instrumentation and software for the surface science and thin-film technology industries. Founded in 1992, its systems are used for monitoring wafer temperature, thin-film stress, deposition rate, thickness, material absorption properties, and Reflection High Energy Electron Diffraction (RHEED). Backed by a commitment to ongoing support, these solutions are currently used worldwide in research and production line monitoring of compound semiconductor-based electronic, optoelectronic, and photovoltaic devices. Extensive input and close collaboration with its worldwide customer base has led to the development of today’s most powerful thin film characterization products.
