CSRefining chip manufacturing with wafer carrier monitoring.  Mapping a carrier’s emissivity and temperature profile exposes microcracks and emissivity variations that can directly impact thin-film deposition and device performance.  Read about our new kSA Emissometer metrology tool in the June 2016 issue of Compound Semiconductor magazine.

Compound Semiconductor Article: MOCVD Carrier Characterization

Thin Film and Industrial Metrology Systems

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