k-Space Associates, Inc., a leader in thin-film metrology tools for the thin-film deposition, semiconductor, compound semiconductor, and solar markets, has announced record annual sales for the kSA 400 product line. They reported an increase of 43% in new system installations in 2015 for their kSA 400 analytical RHEED (Reflection High-Energy Electron Diffraction) system, compared to 2014.
They noted that the increase in kSA 400 system sales is partially attributed to increased installations on deposition chambers operating at higher pressures than the typical UHV systems.
“The use of RHEED guns with differential pumping has allowed RHEED to penetrate higher pressure deposition technologies that were previously off limits. This advancement in RHEED has increased the potential market for kSA 400 systems,” noted kSA Technical Sales Engineer Dr. Carrie Andre. “By supplying a variety of high performance lenses, the kSA 400 can be customized for various chamber geometries and can best analyze the smaller size RHEED images generated in higher pressure deposition chambers.”
The kSA 400 analytical RHEED system combines a high-resolution, high-speed, and high-sensitivity camera with sophisticated RHEED-specific acquisition and analysis software. Because of its advanced capabilities and proven history of over 20 years, the kSA 400 is the preferred analytical RHEED system worldwide for research and manufacturing.
“This was our first product when the company started in 1992, and it has developed and evolved over the years to keep pace with technological advancements in hardware, as well as the requirements and requests of our users. We are in the fifth generation of the kSA 400, and have multiple software upgrades each year to add features that enable further process optimization for our customers,” commented k-Space Associates CEO Darryl Barlett. “It is this constant improvement and our dedicated technical support that keeps customers coming back for more systems.”
To learn more about k-Space or the kSA 400 analytical RHEED system, please visit www.k-space.com.
About k-Space Associates, Inc.
k-Space Associates, Inc. (www.k-space.com) is a leading metrology supplier of advanced instrumentation and software for the surface science and thin-film technology industries. Founded in 1992, its systems are used for monitoring wafer temperature, thin-film stress, deposition rate, thickness, material absorption properties, and Reflection High Energy Electron Diffraction (RHEED). Backed by a commitment to ongoing support, these solutions are currently used worldwide in research and production line monitoring of compound semiconductor-based electronic, optoelectronic, and photovoltaic devices. Extensive input and close collaboration with its worldwide customer base has led to the development of today’s most powerful thin film characterization products.
