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            Products... by Solution
           
 

kSA 400

 

kSA MOS

 

kSA MOS Ultra-Scan

 

kSA RateRat Pro

 

kSA BandiT

  Solutions for...  
  RHEED and
Surface Analysis

               
 
  In-situ Stress/Strain/
Curvature/Bow

 

           
 
  Ex-situ Stress/Strain/
Curvature/Bow
   

 

       
 
  Growth Rate
and Thickness

 

     

 

 
  Temperature of
wafer and/or film
               

 
  Customize

 

 

 

 

 
  Materials

single crystal,
polycrystalline

 

reflective

 

reflective

 

at least two materials with different
index of refraction

 

GaAs, Si, SiC, InP, ZnSe, ZnTe, and GaN

 
  Options

multi-wafer,
plug-ins,
rotational triggering

 

growth rate
and optical constants,
multi-wafer,
Japanese version,
rotational triggering

 

300mm substrates,
1000°C heating stage,
Japanese version,
rotational triggering

 

multi-wafer,
plug-ins,
rotational triggering

 

multi-wafer,
rotational triggering,
wafer mapping

 
            Accessories
                     
   

Screens
RMAT
Pulse Control
downloadable upgrade

 

RMAT
Pulse Control

 

RMAT

 

RMAT
Pulse Control

 

RMAT
Pulse Control