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| Home > Products... by Solution | New product offering: kSA MOS Thermal-Scan | site map |
| Products... by Solution |
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| Solutions for... | ||||||||||
| RHEED and Surface Analysis |
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| In-situ Stress/Strain/ Curvature/Bow |
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| Ex-situ Stress/Strain/ Curvature/Bow |
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| Growth Rate and Thickness |
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| Temperature of wafer and/or film |
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| Customize | ||||||||||
| Materials | single crystal, |
reflective |
reflective |
at least two materials with different |
GaAs, Si, SiC, InP, ZnSe, ZnTe, and GaN |
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| Options | multi-wafer, |
growth rate |
300mm substrates, |
multi-wafer, |
multi-wafer, |
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| Accessories |