RHEED, or Reflection High Energy Electron Diffraction, is a popular thin-film diagnostic technique, offering a wealth of valuable information. Here is what you need for RHEED.

Now in its fourth generation, the kSA 400 seamlessly provides you with the most information from your RHEED pattern, whether you are analyzing a static diffraction pattern or acquiring data during high-speed substrate rotation. Please download the kSA 400 datasheet or kSA 400 specifications for more information and options.

Use your kSA 400 for a variety of tasks, including:

• growth rate
• lattice spacing/strain
• surface coherence
• surface structure/reconstruction
• multiple azimuth/triggering acquisition
• and Low Energy Electron Diffraction (LEED), Phase-Locked Epitaxy, Auger/X-Ray Photoemission Spectroscopy, Electron Gun Control, and Rotation Monitoring and Triggering via our Plug-In Options

We have installed the kSA 400 on just about every molecular beam epitaxy (MBE) chamber type there is, including Riber, Vacuum Generator Scienta, and Veeco. In addition, newly developed RHEED Gun technology allows the kSA 400 to be tailored for advanced sputtering and PLD applications. Our customers include industry leaders, national laboratories, and universities.

Please contact us to discuss your thin-film characterization needs, including in situ stress, strain, curvature, bow, growth rate, thickness, and surface analysis.