 Up to 96-bit deep image storage, resulting in higher accuracy for exposure control and frame summation.
Real-time display of several diffraction features (during growth, annealing, etc.), including:
- intensities (peak, average, centroid)
- lattice spacing/strain
- FWHM/coherence
- line profile(s)
- analog input voltages
RHEED-specific analysis routines, including algorithms for determining in-plane lattice spacing, in-plane coherence length, and growth rates and thicknesses.
Image processing filters, including background subtraction, inelastic background subtraction, gamma correction, log scaling, edge detection, rotation, binning, contrast maximization, 2D FFT, median filtering, and histogram equalization.
Data processing filters and fitting algorithms, including polynomial, Lorentzian, and Gaussian fitting, low and high band pass filters, multiple derivatives, and cubic spline fitting.
Optional user-programmable processing and analysis routines.
A multitude of image acquisition capabilities, including single image, multiple images, multiple regions, digital movies, and interactive image accumulation. “Scan Mode” images naturally show diffraction pattern evolution and yield simple time-resolved diffraction analysis.
Full digital movie acquisition and play back capability. Play back movies in Scan Mode as if the movie is the video source for acquisition.
Publication quality 2D and 3D graphics allow you to visualize diffraction data and fine tune graphics by changing fonts, font sizes, labels, axes, and so on. 3D image display of “Scan Mode” images shows detailed diffraction pattern evolution.
Complete image archiving capability, storing image as well as image acquisition parameters (time, user comments, exposure time, image type, etc.).
Completely integrated, context-sensitive user manual.
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