k-Space references are a compilation of published papers that either offer a review of the techniques used by the kSA 400, or specifically use the kSA 400 for work within the paper.
Reviews on RHEED:
1. Introduction to RHEED
A.S. Arrott
Ultrathin Magnetic Structures I, Springer-Verlag, 1994, pp. 177-220
2.
A Review
of the Geometrical Fundamentals of RHEED with Application to Silicon Surfaces
John E. Mahan, Kent M. Geib, G.Y. Robinson, and Robert G. Long
J.V.S.T. A 8, 1990, pp. 3692-3700
kSA 400 References:
1.
In Situ Composition Monitoring Using RHEED for SrTiO3 Thin Films Grown By Reactive Coevaporation
Luke S.-J Peng and Brian H. Moeckly, J.V.S.T. A 22, 2004, pp. 2437-2439
2.
RHEED Monitoring of Rotating Samples During Large-Area Homogeneous Deposition of Oxides
V. C. Matijasevic, Z. Lu, K. Von Dessonneck, C. Taylor, D. Barlett
MRS Fall Meeting, 1997
3.
Growth and magnetic properties of Co x Ni 1-x ultrathin films on Cu(100)
F. O. Schumann, S. Z. Wu, G. J. Mankey, and R. F. Willis
Physical Review B, Vol. 56, no.5, 1997
4.
Smoothening of Cu films grown on Si(001)
R. A. Lukaszew, Y. Sheng, C. Uher, and R. Clarke
Appl. Phys. Lett., Vol. 76, no.6, 2000
5.
Temperature-Dependent Strain Relaxation and Islanding of Ge/Si(111)
P. W. Deelman, L. J. Schowalter, and T. Thundat
Proc. Materials Research Society Vol. 399 (1996)
6.
Structural transition in epitaxial Co-Cr superlattices
W. Vavra, D. Barlett, S. Elagoz, C. Uher, and R. Clarke
Physical Review B Vol. 47, no.9, 1993
7.
Resonant RHEED Study of Cu 3Au(111) Surface Order
S. W. Bonham and C. P. Flynn
University of Illinois at Urbana-Champaign
8.
Molecular Beam Epitaxial Growth of InAs/AlGaAsSb Deep Quantum Wells on GaAs Substrates
N. Kuze, H. Goto, S. Miya, S. Muramatsu, M. Matsui, I. Shibasaki
Proc. Materials Reearch Society Vol. 3999 (1996)
9. Studies of Exchange Coupling in Fe(001) Whisker/Cr/Fe Structures using BLS and RHEED Techniques
B. Heinrich, M. From, J. F. Cochran, L. X. Liao, Z. Celinski, C. M. Schneider and K. Myrtle
Mat. Res. Soc. Symp. Proc. Vol. 313
10.
The Use of RHEED Intensities for the Quantitative Characterization of Surfaces
Y. Ma, S. Lordi and J. A. Eades
Proc. Materials Research Society Vol. 399 (1996)
11.
The molecular beam epitaxy growth of InGaAs on GaAs(100) studied by in situ scanning tunneling microscopy and reflection high-energy electron diffraction
C. W. Snyder, D. Berlett, B. G. Orr, P. K. Bhattacharya and J. Singh
J. Vac. Sci. Technol. B 9 (4), Jul/Aug 1991
12. Morphology Transition and Layer-by-Layer Growth of Rh(111)
F. Tsui, J. Wellman, C. Uher, and Roy Clarke
Physical Review Letters, Vol. 76, no. 17, 1996
13. CCD-Based RHEED Detection and Analysis System
D. Barlett, C.W. Snyder, B.G. Orr, and Roy Clarke
Rev. Sci. Instrum. 62, 1991, pp. 1263-1269
|
