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Phase-Locked Epitaxy (PLE)

The kSA 400 PLE plug-in option automatically controls layer-by-layer growth by using real-time monitoring of Reflection High Energy Electron Diffraction (RHEED) oscillations to automate shutter open and close times. This yields atomic-level accuracy and reproducible results for thin films.

The PLE plug-in option combines a highly sophisticated PLE algorithm, programmable Process Table, and digital I/O board, all seamlessly integrated into the kSA 400 environment.

• Highly sophisticated PLE algorithm continuously monitors 1st derivative of real-time intensity data
• Fitting parameters include minimum slope values to eliminate noise and transients
• Peaks, valleys, or both peaks and valleys can be phase-locked
• Timed growth control is available when intensity oscillations are absent
• Programmable process table: up to 8 processes, 1000 cycles, and delay/recovery timing
• Generate complete growth recipes for advanced processes
• 8-channel digital I/O board and cabling enables software-controlled shutters (open/close on voltage high/low)
• PLE data acquisition is saved just like kSA 400’s Scan Mode, enabling the full suite of analysis tools

LEED I/V

The kSA 400 is ideal for LEED imaging. The LEED IV plug-in option automatically tracks the evolution of the Low Energy Electron Diffraction pattern to obtain Intensity versus accelerating Voltage curves. In addition, acquire a movie of the entire IV acquisition for future playback and analysis.

Designed by k-Space engineers to integrate seamlessly into the kSA 400 system, the LEED IV plug-in option combines a kinematic scattering algorithm for tracking and a 16-bit D/A controller board with cables for LEED energy control. For the scientist who needs IV data, the LEED IV plug-in gives instant results at an affordable price.

• Sophisticated tracking algorithm that uses kinematical scattering, intensity tracking, or both for accurate I/V acquisition
• Standard 8-bit dynamic range or optional 10/12-bit dynamic range and high S/N ratio digital cameras
• LEED IV acquisition mode includes detailed energy control and tracking data saved just like kSA 400’s Scan Mode
• Complete exposure control and frame averaging, yielding the highest quality quantitative images for analysis

Auger/X-Ray Photoemission Spectroscopy (AES/XPS)

The kSA 400 Auger/XPS Photoemission Spectroscopy plug-in option gives you an inexpensive and easy way to acquire Auger Electron Spectroscopy (AES) and X-ray Photoemission Spectroscopy (XPS) data via the kSA 400 system. AES and XPS are both powerful techniques for surface analysis, relying on material-specific photoelectron energy signatures from either electron (AES) or X-ray (XPS) induced photoelectron emission.

The Auger/XPS kSA 400 Plug-In provides complete computer control of the energy of the analyzer, stepping through a user-specified range of energies at a user-specified resolution (via a 12-bit D/A channel). The user may also specify the sample number at each energy, scan rate, number of scans, and map the output voltage. During data acquisition, which may be externally triggered, the photoelectron signal is analyzed (via either a 12-bit or 16-bit analog input channel) at each energy . Data is displayed in real-time during acquisition and all data is stored to an ASCII file upon completion.

Auger/XPS Spectroscopy Input Parameters

Number of Spectra - The number of spectra specified averaged together at each energy, resulting in a single, average spectra at the end of the run

Start/Stop Energy - Starting/stopping energy for each spectra acquired

Resolution - Energy resolution of the acquisition, i.e., energy spacing between data points

Samples/Point - Number of samples per energy point, for reducing any electron-counting-signal noise

Advanced Acquisition Options

• Delay Time - Specify a delay between acquisitions to allow Auger/XPS electronics to stabilize at each energy value before reading the input signal
• Delay on Reset - Set a delay between spectra acquisitions when obtaining multiple spectra to allow the Auger/XPS power supply to stabilize after ramping from stop energy to start energy
• Gain/Offset - Calibrate the system so the Auger power supply corresponds with the electron gun power supply; set the gain and offset of the Input/Output boards for Auger, LEED I/V, video digitizer and electron gun output control

The kSA 400 supports complete R-DEC 30keV electron gun control.

Electron Gun Control and Beam Rocking

The kSA 400 Electron Gun Control plug-in option allows for full control of electron guns. Store gun control settings and immediately ramp to them, fine tuning while simultaneously viewing the diffraction pattern and acquiring Reflection High Energy Electron Diffraction (RHEED) rocking curves—all with the click of the mouse.

Using a 16-bit D/A board for precise control, the Electron Gun Control plug-in generates a “front panel” control center for complete gun operation via the computer. Combined with the multi-threaded kSA 400 system, obtain complete gun control with simultaneous acquisition and analysis— the ultimate in analytical RHEED.

• Supports Staib Instruments, R-DEC Co. Ltd., and Vieetech Japan Co., Ltd. lines of electron guns
• Integrated “front panel” for modifying electron gun settings while performing acquisition, analysis, or any other task
• 16-bit resolution of all electron gun control parameters and beam blanking on/off control
• Integrated, automated rocking curve via Energy-Resolved RHEED acquisition mode
• Simultaneous display of diffraction pattern and electron gun control settings
• Preset, user-defined gun control settings for immediate ramping to diffraction conditions
• Precise spot position maintenance through X and Y deflection 5th-order polynomial link to beam rocking (for Staib guns with beam rocking)

Get the most from your analytical RHEED system by maximizing the features of your electron gun with the kSA 400 Electron Gun Control plug-in.