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kSA BandiT - Real-time Wafer Temperature Sensing
References    

k-Space references are a compilation of published papers that either offer a review of the techniques used by the kSA BandiT, or specifically use the kSA BandiT for work within the paper.

1. Diffuse optical reflectivity measurements on GaAs during MBE processing

C. Lavoie, S.R. Johnson, J.A. Mackenzie, T. Tiedje, and T. van Buuren, J.V.S.T. A 10, 1992, pp. 930-933.

2. Precision of noninvasive temperature measurement by diffuse reflectance spectroscopy

T.P. Pearsall, Stevan R. Saban, James Booth, Barrett T. Beard Jr., and S.R. Johnson, Rev. Sci. Instrum. 66, 1995, pp. 4977-4980.

3. In situ temperature control of MBE growth using band-edge thermometry

Shane Johnson, Chau-Hong Kuo, Martin Boonzaayer, Wolfgang Braun, Ulrich Koelle, Yong-Hang Zhang, and John Roth, J.V.S.T. B 16, 1998, pp. 1502-1506.