k-Space Associates, Inc. specialize in real-time, in-situ, thin-film process monitoring tools for MBE, MOCVD, PVD, PLD, sputtering, and thermal evaporation. Applications include research and production line monitoring of compound semiconductor-based electronic, optoelectronic, and photovoltaic devices.

Our suite of products allows for real-time monitoring and control of temperature, stress, thickness, deposition rate, surface roughness, optical absorption characteristics, RHEED and LEED analysis, and many other important thin-film parameters during thin-film deposition.

We take pride in providing first rate technical support:  no automated queues, no slow response times.  When you call, you'll always get a friendly k-Space person to direct your call to the appropriate engineer.  Or, contact us via email - we guarantee we'll respond within 1 business day.  

Contact us today so we can discuss your thin-film monitoring needs.

ICMOVPE
16th International Conference on Metal Organic Vapor Phase Epitaxy (JWC - kSA representative in Korea)

May 20-25 2012
Paradise Hotel Busan, Korea

Intersolar Europe

June 11-14, 2012

Munich trade Fair Centre, Germany

EMC 2012

Electronic Materials Conference 2012

June 20-23, 2012
Penn Stater Conference Center, Pennsylvania State University

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k-Space Associates, Inc. is a leading supplier of advanced instrumentation and software for the surface science and thin-film technology industries.

Extensive input and close collaboration with its worldwide customer base has lead to the development of today’s most powerful thin film characterization products. We pride ourselves on the ability to listen carefully, deliver a valuable product, and exceed expectations for support.

We look forward to helping you with your thin-film characterization and surface science needs. Please feel free to fill out our online form or contact us for further information.