Our product line utilizes optical imaging technology for determining thin-film stress, strain, wafer curvature, deposition rate, layer thickness, semiconductor wafer temperature, RHEED and LEED analysis and advanced process control.

All kSA scientific imaging products focus on real-time data acquisition, processing, and analysis.

Accurate and precise in-situ process monitoring facilitates a clear understanding of the deposition process as well as increases yields in the production environment. Contact us today so we can discuss your thin-film monitoring needs.